RESEARCH OF THEORETICAL MODEL OF FAILURES OF THE MICROELECTRONICBLOCK НСС
Keywords:
microelectronic block НСС, electrical radio products, basic failure intensity, mathematical model of operational failure intensityAbstract
The issues of researching the model of failures developed by the microelectronic block, which controls paired arrows, obtaining the numerical value of the operational intensity of the microelectronic block failures, researching the theoretical model of failures, obtained the numerical values of the operational intensity of the microelectronic block failures are discussed in this article. The main contribution that determines the magnitude of the operational failure intensity of the block НСС under investigation is the operational failure intensity of the board, which is two orders of magnitude higher than the similar indicators of other components of the microelectronic block НСС.
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